Survey of Materials Characterization Methods
(co-instructor: Greg Haugstad
University of Minnesota)
1.5 Day Course
Monday/Tuesday, Feb. 26/27
Analytical Metrology, Atomic Force Microscopy, Microscopy, Nanoscience, Surface Analysis, X-Ray Diffraction
$850 ($1175 after Feb. 5)
The course will provide an overview of materials characterization methods used to probe a wide variety of properties with an emphasis on real-world applications in industries including biomedical, pharmaceutical, chemicals, personal care, semiconductor, coatings, and energy. It will cover both a basic and deeper understandings of commonly available techniques, and correspondingly both basic and more insightful applications.
We explore capabilities to measure material properties such as morphology, elemental information, chemical information, and mechanical/electrical properties. Techniques covered include: XPS, SEM, TEM, XRD, Raman/IR, nanoindentation, AFM. For each technique, an overview of each method will be presented explaining basics of operation as well as some finer points and more advanced understandings; this is followed by applications to various industries. The purpose is to provide attendees with a basic landscape of what capabilities are possible and how to astutely use these methods to solve practical real-world problems; and in the process, how to avoid certain misconceptions. Overall the course will compare and contrast differences in capabilities, sample preparation required, and information provided from these methods.
All industries with materials characterization needs: micro/nano-electronics, biomedical tech, pharma, plastics/polymers, adhesives/modifiers, agriculture, bio- and personal-care products with scientists and engineers interested in what methods are available to characterize their materials on the nanoscale, with emphasis on surface sensitive techniques.
1. X-ray photoelectron spectroscopy and time of flight secondary ion mass spectrometry [XPS, TOF-SIMS]
2. Electron microscopy based methods: SEM/TEM X-ray diffraction [XRD]
3. AFM/SPM – fundamentals
4. Raman and AFM-Raman
5. Fourier Transform Infrared Spectroscopy [FTIR]
6. Nano-IR [Photothermal and near-field methods]
7. AFM applications [environmental/fluid measurements, intermodulation mode]
Dalia Yablon is the founder of SurfaceChar, an AFM and nanoindentation based consulting company in the Greater Boston area. She spent over a decade developing and leading nanoscale characterization microscopy at ExxonMobil and edited a book on “SPM in Industrial Applications” [Wiley Publishing]. She holds an A.B. in Chemistry from Harvard University and a Ph.D. in Physical Chemistry from Columbia University. She teaches about scanning probe microscopy and nanoscale characterization methods internationally.
Greg Haugstad is a condensed matter physicist with degrees from Gustavus Adolphus College and University of Minnesota. He is technical staff member and director of the Characterization Facility (CharFac) at the University of Minnesota. Since 2001 he has served on the graduate faculty at UMinn, with a materials characterization emphasis. His teaching has included graduate courses in imaging, spectrometry and nanomechanics; undergraduate characterization labs; nanocharacterization capstone courses for 2-year students; training classes for the CharFac; and national-reach short courses.
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